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   High-Level Decision Diagram Simulation for Diagnosis and Soft-Error Analysis - (2010)
        Author: Raik, Jaan
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   High-Speed Logic Level Fault Simulation - (2010)
        Author: Ubar, Raimund
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Software-Based Self-Test of Embedded Microprocessors - (2010)
        Author: Reorda, Matteo Sonza
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   SoC Self Test Based on a Test-Processor - (2010)
        Author: Vierhaus, Heinrich Theodor
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Delay Faults Testing - (2010)
        Author: Gramatová , Elena
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Low Power Testing - (2010)
        Author: Kotásek , Zdenek
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Thermal-Aware SoC Test Scheduling - (2010)
        Author: Eles, Petru
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs - (2010)
        Author: Ingelsson, Urban
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Reduction of the Transferred Test Data Amount - (2010)
        Author: Novák , Ondrej
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…

   Sequential Test Set Compaction in LFSR Reseeding - (2010)
        Author: Raik, Jaan
        Publisher: IGI Global
        URL: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-60960-2…