Design and Test Technology for Dependable Systems-on-Chip
Design and Test Technology for Dependable Systems-on-Chip
Place:
Hershey
Publisher:
IGI Global
Phys descriptions:
xxvi, 550 p.: ill.
Date published:
2010
Record type:
Editor:
Ubar, Raimund|Raik, Jaan|Vierhaus, Heinrich Theodor
Subject:
Call No:
004.724.2:62-493 DES
Abstract:
This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)
Language:
Series:
Advances in Computer an Electical Engineering(ACEE) book series
Catagory URL:
CITATION: . Design and Test Technology for Dependable Systems-on-Chip edited by Ubar, Raimund|Raik, Jaan|Vierhaus, Heinrich Theodor . Hershey : IGI Global , 2010. - Available at: https://library.au.int/design-and-test-technology-dependable-systems-chip-4